a-Stratified Methods Combining Item Exposure Control and General Test Overlap in Computerized Adaptive Testing
GUO Lei;WANG Zhuoran;WANG Feng;BIAN Yufang
(1 National Key Laboratory of Cognitive Neuroscience and Learning, Beijing Normal University, Beijing 100875, China) (2 National Cooperative Innovation Center for Assessment and Improvement of Basic Education Quality, Beijing Normal University, Beijing 100875, China)
GUO Lei;WANG Zhuoran;WANG Feng;BIAN Yufang. (2014). a-Stratified Methods Combining Item Exposure Control and General Test Overlap in Computerized Adaptive Testing. Acta Psychologica Sinica, 46(5), 702-713.